CN TC
Enter search keywords！
Memory IC test
Home > Test Solution > Memory IC test >

SCROLL
KLT's testing platform is continuously expanded. Engineering services can be applied to Flash Memory-NOR and NAND TYPES, Mask-Rom, EPROM, EEPROM, DRAM, SDRAM, DDRI& DDRII, SRAM, PSEUDO SRAM and Memory Embedded ICs. These terminal product applications include mobile phone, DSC, DV, game console, DRAM module, smart card, PC and PC peripheral equipment.
We can provide a complete test platform to support Memory IC test.
Vendor Model
Advantest T5335/T5365
T5371
T5377
T5581
T5830
Verigy V5400
Credence Kalos
Teradyne M5
About Us
Company Profile Company Culture Development Path Certificate
Policy
Quality Policy EHS Policy Labor and corporate moral policy
Service Items
Wafer needle test Wall grinding/cutting/grain picking IC finished product test/foot sweeping foot Aging test
Test Solution
Memory IC test Consumer IC test Logic/Mix Signal/SOC Product test RW wafer re-packaging and construction technology CIS test RF wireless radio frequency IC test MEMS test Fingerprint IC test Burn In Integration Automation Test
Technical Support
Self -made machine test solution Automatic control technology Aging test development(Burn-In) Laboratory
Join Us
Salary Learning Development Salary Living Garden
News
Contact Us
  • Hotline: +86-512-62535188

  • Address: No. 183 Fangzhou Road, Industrial Park, Suzhou City, Jiangsu Province

  • Mail: marvin_chen@kltech.com.cn
Share and follow
Links Zhenkun Technology

Copyright © King Long Technology(SuZhou) Limited. All rights reserved. Web design

Sitemap | Legal Notices | Privacy Policy |