Wafer needle test - King Long Technology(SuZhou) Limited.

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KLT provides a wide range of testing platforms for wafer test solutions. The size of the wafer needle test can support 6 inches, 8 inches, 12 inches, and the test temperature can be satisfied from -55 ℃ ~ 150 ℃. , Other products Class1000.

Other service items of wafer needle test include:

Laser repair

Pre -fever

Wafer cycling

Wafer baking

Wafer INK
KLT has an independent probe card design & maintenance capabilities.

Vertical probe card and cantilever probe card

6912Pins, 8 layers probe card

Fine spacing LCD probe card

Alignment and contact resistance/leakage measurement

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Wafer needle test Wall grinding/cutting/grain picking IC finished product test/foot sweeping foot Aging test

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Memory IC test Consumer IC test Logic/Mix Signal/SOC Product test RW wafer re-packaging and construction technology CIS test RF wireless radio frequency IC test MEMS test Fingerprint IC test Burn In Integration Automation Test

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Hotline: +86-512-62535188
Address: No. 183 Fangzhou Road, Industrial Park, Suzhou City, Jiangsu Province
Mail: cn_yang@kltech.com.cn

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